close

Accelerated Testing

Wayne B. Nelson · ISBN 9780471697367
Accelerated Testing | Zookal Textbooks | Zookal Textbooks
Format:
Out of stock
NZ$281.95
-
+
Publisher John Wiley & Sons Inc (US)
Author(s) Wayne B. Nelson
Subtitle Statistical Models, Test Plans, and Data Analysis
Edition 1
Published 7th September 2004
Related course codes

Statistical Models, Test Plans, and Data Analysis

The Wiley-Interscience Paperback Series consists of selected books
that have been made more accessible to consumers in an effort to
increase global appeal and general circulation. With these new
unabridged softcover volumes, Wiley hopes to extend the lives of
these works by making them available to future generations of
statisticians, mathematicians, and scientists.

". . . a goldmine of knowledge on accelerated life testing
principles and practices . . . one of the very few capable of
advancing the science of reliability. It definitely belongs in
every bookshelf on engineering."

?Dev G. Raheja, Quality and Reliability Engineering
International


". . . an impressive book. The width and number of topics
covered, the practical data sets included, the obvious knowledge
and understanding of the author and the extent of published
materials reviewed combine to ensure that this will be a book used
frequently."

?Journal of the Royal Statistical Society


A benchmark text in the field, Accelerated Testing: Statistical
Models, Test Plans, and Data Analysis offers engineers, scientists,
and statisticians a reliable resource on the effective use of
accelerated life testing to measure and improve product
reliability. From simple data plots to advanced computer programs,
the text features a wealth of practical applications and a clear,
readable style that makes even complicated physical and statistical
concepts uniquely accessible. A detailed index adds to its value as
a reference source.

Translation missing: en.general.search.loading